ERIE, Pa. - Eriez has introduced an extra wide combination E-Z Tec® Dual-Beam Multi-Zone X-Ray and Metal Detector System. This state-of-the-art device offers optimal detection and precise rejection of virtually any foreign object for packaged or bulk flow applications.
Working together, the X-Ray will provide Eriez customers with unsurpassed foreign objects detection for ferrous, nonferrous, stainless steel and non-metallics such as stone, glass, bone and some plastics. Additionally, the metal detector will provide for the best possible detection for aluminum — which is the most difficult metal for the X-Ray machine to detect, according to Ray Spurgeon, Eriez Product Manager — Inspection Systems. “Now, processors can use both technologies to improve their food safety,” he says.
An additional benefit of the dual beam X-Ray System is it offers zone detection as packaged or raw product moves through the unit, according to Spurgeon. Rather than rejecting an entire row of product, the X-Ray unit will pinpoint a single product with a foreign object for precise rejection, thus allowing non-contaminated product to proceed.
Moreover, Eriez X-Ray Systems operate using very low beam energy because of the company’s unique beam architecture. This design places Eriez’ X-Ray source very close to the belt/product and thus, the lowest energy.
The dual beam technology also provides coverage for a conveyor belt more than 40 inches wide. Traditional X-Ray systems have accommodated belts up to 24 inches, according to Spurgeon.
The Eriez E-Z Tec DSP Metal Detector complements the dual beam X-Ray system by detecting ferrous, nonferrous, stainless steel and aluminium objects in package and raw product. The standard three-coil aperture arrangement sends a signal to the unit’s control for digital processing.
According to Spurgeon, the E-Z Tec X-Ray system and E-Z Tec DSP Metal Detector can be monitored and controlled remotely by using Eriez E-Z Link software.
For more information visit www.eriez.com
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